STM、AFM、SEM和TEM对溶液中纳米微粒形貌和粒度分布的检测  

Examination of the Morphology and Size Distribution of Nanoparticles in Solutions by STM,AFM,SEM and TEM

作　　者：万牡华[1] 欧阳健明[1] 

机构地区：[1]暨南大学生物矿化与结石病防治研究所,广州510632

出　　处：《人工晶体学报》2007年第6期1422-1430,1421,共10页Journal of Synthetic Crystals

基　　金：国家自然科学基金(No.30672103);广东省科技攻关项目(2005B30701003);广州市重点科技项目(2001-Z-123-01)

摘　　要：纳米材料因其独特的光、电、磁、力、催化和吸附等性能而被广泛应用。纳米微粒的检测是纳米材料和纳米科技发展的重要保证。本文综述了采用扫描隧道显微镜(STM)、原子力显微镜(AFM)、扫描电子显微镜(SEM)和透射电子显微镜(TEM)等现代显微镜技术检测溶液中纳米微粒形貌和粒度分布研究进展,并比较了这些方法的差异。Nanomaterials have been used in many fields because of their unique properties in optics, electrics, magnetics, mechanics, catalysis and adsorption etc. Nanoparticles examination is an important guarantee for the development of nanoscience and nanotechnology. This paper reviews the applications of some modern technique such as scanning tunneling microscopy （STM）, atomic force microscopy （ AFM）, scanning electron microscopy （SEM） and transmission electron microscopy （TEM） etc in the determination of the morphology and size distribution of nanopartlcles in the solution. The difference among these methods was also comparatively discussed.

关 键 词：纳米微粒 STM AFM SEM TEM 

分 类 号：O766[理学—晶体学]