X射线法测量粘结炸药的残余应力  

Residual Stress Test of Bonded Explosives by X-ray Diffraction Method

作　　者：雍志华[1] 朱世富[1] 赵北君[1] 陈靖华[1] 张伟斌[2] 韦兴文[2] 

机构地区：[1]四川大学材料科学与工程学院 [2]中国工程物理研究院,四川绵阳621900

出　　处：《四川大学学报（工程科学版）》2007年第5期101-105,共5页Journal of Sichuan University (Engineering Science Edition)

基　　金：国家自然科学基金-中国工程物理研究院联合基金资助项目(10476016)

摘　　要：用X射线衍射法测量了高聚物粘结炸药(PBX)的残余应力,在2θ=72.5°附近发现三氨基三硝基苯(TATB)的新衍射峰,测出PBX的残余应力均为拉应力,大小约几个兆帕,边缘位置应力大于中心部位,对样品进行热处理或放置一段时间后应力减小,不同成型压力PBX的晶粒尺寸有差异。实验结果表明,X射线衍射法测量PBX的残余应力是一种方便有效的方法,对PBX残余应力的研究及其应用具有重要意义。Residual stress of polymer bonded explosive （PBX） was tested by x-ray diffraction method and a new diffraction peak, which has not yet been reported in TATB （triamino-trinitrobenzene） PDF card, was discovered at near 72.5°. Residual stress of the explosives were all draw stress with several MPa, and the stress of edge is larger than the central. The residual stress of explosive would be reduced through thermal treatment or laying for somg time . Grain sizes were different with pressure change. The results showed that x-ray diffraction is a convenient and effective method for the residual stress measurement of PBX and has importance significance for the research into residual stress and applicatios of PBX.

关 键 词：高聚物粘结炸药 X射线衍射法 残余应力 应力分布 热处理 

分 类 号：O781[理学—晶体学]