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机构地区:[1]浙江大学信息与电子工程学系,浙江杭州310028
出 处:《浙江大学学报(理学版)》2008年第1期40-43,47,共5页Journal of Zhejiang University(Science Edition)
摘 要:为提高数字电路的可测性,提出了可实现任意逻辑函数的正极性或-符合网络的易测性实现,并给出了测试网络中所有单固定故障的通用测试集.该实现基于逻辑函数的正极性或-符合展开,网络的同或部分分别采用了串联和树形结构.为提高可测性,同或串的实现结构只需增加1个控制端及1个观察端,同或树的实现结构只需增加3个控制端及1个观察端.对于1个n变量的逻辑函数,两种实现结构下通用测试集的基数分别为(n+4)和(n+5).这样短的通用测试集非常适合用内建自测试实现,从而有效地缩短测试时间.For improving testability of digital circuits, easily testable realizations of positive polarity OR-Coincidence network (PPOC network) for arbitrary logic functions were proposed and universal test sets which detect all single stuck-at faults in the network were given. The realizations were based on positive polarity OR-Coincidence expansion (PPOC) of logical functions and the Exclusive-NOR (EXNOR) part of the network emploied cascade or tree structure. For improving testability, only one control point and one observation point are needed for the realization with EXNOR-eas- eade and three control points and one observation point for the realization with EXNOR-tree were needed. For an n-variable function, the cardinal numbers of universal test sets for the two realizations were (n+4) and (n+5) respectively. It's very suitable to be generated by Built-in Self-Test for such short universal test sets and test time can be saved greatly.
关 键 词:通用测试集 可测性设计 或-符合展开 单固定故障
分 类 号:TP331[自动化与计算机技术—计算机系统结构]
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