双光栅并联匹配解调技术的工程化研究  

Study on Engineering Application of Dual Gratings Parallel Matched Interrogation Technique

作　　者：杨熙春[1] 裴金成[1] 詹亚歌[1] 朱汝德[1] 何红[1] 向世清[1] 

机构地区：[1]中国科学院上海光学精密机械研究所

出　　处：《光子学报》2008年第1期42-45,共4页Acta Photonica Sinica

基　　金：上海市科委专项基金(0116610811)资助

摘　　要：在分析和综合其他数据处理方案优缺点的基础上,提出了一种基于分区查表法的有效数据处理方案.该方案先确定待处理的电压商值在三段近似线性曲线上所属区域,再执行查表法将其和微应变量一一对应.这种处理方案不但解决了传统单匹配解调技术中的双值和可测试范围小的问题,而且提高了测试准确度.根据实验结果,采用普通的光纤光栅对,系统可传感的应变范围可达525με,准确度可达±1με.A credible and effective data processing scheme based on a novel divisional look-up table is proposed. Any pending data is confirmed which section it belongs to, then is looked up table to correspond to microstrain by the scheme. It solves inherent problems of the traditional one： double-values and small measurable range, and enhances the precision. The experimental results indicate,the measurable range of the system is 525 με,and the precision is ±1με based on normal matched gratings.

关 键 词：双光栅并联匹配 布喇格光栅 应变 查表法 

分 类 号：TP212.14[自动化与计算机技术—检测技术与自动化装置]