高压储能电容器内部与油质缺陷的直流局部放电  

DCPD Investigation on Inner and Oiliness Defects of High-Voltage Storage Capacitors

作　　者：张血琴[1] 吴广宁[1] 曲衍宁[1] 王鹏[1] 边姗姗[1] 李晓华[1] 

机构地区：[1]西南交通大学电气工程学院,成都610031

出　　处：《电工技术学报》2008年第2期76-81,共6页Transactions of China Electrotechnical Society

基　　金：国家自然科学基金联合基金(10476022);西南交通大学博士创新基金资助项目

摘　　要：直流局部放电(DCPD)测试技术是评估高压储能电容器绝缘性能的有效手段,其中利用DCPD参量表征缺陷对电容器绝缘状态的影响程度是关键问题。为了分析缺陷与DCPD参量之间的关系,本文针对两种基本缺陷——内部和油质缺陷,进行了有限元仿真,局部放电参量与介质缺陷物理参数关系的讨论,以及两类含缺陷的电容器的DCPD测试。三种方法得到的结果相互验证,表明内部缺陷对绝缘介质的影响更大,虽然油质缺陷对绝缘介质的影响较小,但仍应避免此类缺陷的形成。Direct current partial discharge （DCPD） detection technique is an efficient method to insulation evaluation of high-voltage storage capacitors. The principal problem is mastering the relationship between DCPD parameters and defects condition in insulation. Three ways are carried on inner and oiliness defects capacitor in this paper. They include finite element analysis （FEA） , discussing between DCPD parameters and defect physics characters, and DCPD measurement on two kinds of capacitors. From the consistent results, it indicates that inner defect had greater influence to dielectric. Although it has less impact, oiliness defect still should be avoided.

关 键 词：高压储能电容器 直流局部放电 有限元仿真 缺陷 参量 

分 类 号：TM835[电气工程—高电压与绝缘技术] TM531