ICP-MS测定高纯氧化镥中痕量稀土和非稀土杂质研究  

Determination of Trace Rare Earth and Non rare Earth Impurities in High purity Lutetium Oxide by ICP MS

作　　者：张楠[1] 刘湘生[1] 蔡绍勤[1] 

机构地区：[1]北京有色金属研究总院测试所

出　　处：《分析测试学报》1997年第3期69-72,共4页Journal of Instrumental Analysis

摘　　要：本文报道了ＩＣＰＭＳ直接测定高纯（９９．９９９％～９９．９９９９％）氧化镥中痕量稀土和非稀土杂质的新方法。对ＩＣＰＭＳ测定中产生的谱干扰和基体效应进行了详细考查。试验结果表明：用Ｃｓ作内标，可有效地补偿因氧化镥引起的基体效应。方法的检出限在０．ｘ～０．０ｘμｇ／Ｌ范围；相对标准偏差（ＲＳＤ）（ｎ＝７）＜１０％。本法已应用于高纯氧化镥工艺流程分析和产品分析。A method for the determination of trace amounts of rare earth and non rare earth impurities in high purity lutetium oxide(99.999%～99.9999%)by ICP MS is described.The spectroscopic interference and matrix effect of the ICP MS method have been investigated.Cesium,when used as an internal standard,can effectively compensate the matrix suppression effect and sensitivity drift.The detection limits are in the range of 0.006～0.035 μg/L and 0.04～0.14 μg/L for rare earth and non rare earth impurities,respectively.The recoveries are 84%～112% with RSD in the range of 1.2%～8.3%( n =7).

关 键 词：等离子体质谱 氧化镥 稀土 纯度分析 ICP MS 

分 类 号：O614.347[理学—无机化学]