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机构地区:[1]State Key Laboratory of Crystal Materials,Shandong University
出 处:《Chinese Journal of Structural Chemistry》2008年第3期261-266,共6页结构化学(英文)
基 金:State 973 Program of China (2004CB619002)
摘 要:Potassium tantalate niobate (KTa1-xNbxO3, KTN) crystals with different dimensions and quality situations were grown by Czochralski method. Crystal growth process and morphology properties of KTN are presented in this paper. It was found that some defects, such as bubble, inclusion, crack, dislocation etc., can all appear if the crystal is grown in an improper condition. The character and formation mechanism of such defects in macro growth are discussed. We consider that the CO2, which was not released absolutely during the sintering process and dissolved in the melt, led to bubbles. The composition of the inclusion caused by high pulling and rotation rates is KTN polycrystalline. The crack and dislocation in KTN crystal mainly come from improper temperature field. Etching and high-resolution X-ray diffraction (HRXRD) experiment results indicate that the central area is the defects concentrated.Potassium tantalate niobate (KTa1-xNbxO3, KTN) crystals with different dimensions and quality situations were grown by Czochralski method. Crystal growth process and morphology properties of KTN are presented in this paper. It was found that some defects, such as bubble, inclusion, crack, dislocation etc., can all appear if the crystal is grown in an improper condition. The character and formation mechanism of such defects in macro growth are discussed. We consider that the CO2, which was not released absolutely during the sintering process and dissolved in the melt, led to bubbles. The composition of the inclusion caused by high pulling and rotation rates is KTN polycrystalline. The crack and dislocation in KTN crystal mainly come from improper temperature field. Etching and high-resolution X-ray diffraction (HRXRD) experiment results indicate that the central area is the defects concentrated.
关 键 词:potassium tantalate niobate (KTa1-xNbxO3 KTN) crystal growth czochralskimethod HRXRD growth defect etching
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