任意极性或-符合型易测性网络及测试集  

Easily testable network of arbitrary polarity OR-Coincidence type and test sets

作　　者：潘张鑫[1] 陈偕雄[2] 阮谢永[1] 

机构地区：[1]绍兴文理学院物理与电子工程系,浙江绍兴312000 [2]浙江大学信息与电子工程学系,浙江杭州310028

出　　处：《浙江大学学报（工学版）》2008年第3期407-411,共5页Journal of Zhejiang University：Engineering Science

摘　　要：为提高数字电路的可测性,提出了一种可实现任意逻辑函数的任意极性或-符合型易测性网络,并给出了测试网络中所有单固定故障的通用测试集.该网络基于逻辑函数的混合极性及同或积的或-符合表示,其同或部分分别采用了串联和树形结构.为提高可测性,用同或串的网络结构只需增加2个控制端及1个观察端,用同或树的网络结构只需增加4个控制端及1个观察端.对于一个n变量的逻辑函数,2种结构下通用测试集的基数分别为n+7和n+10.这种短的通用测试集非常适合用内建自测试实现,从而有效地缩短了测试时间.In order to improve the testability of digital circuits, an easily testable network of arbitrary polarity OR-Coincidence type for arbitrary logic functions was proposed and the universal test sets which could detect all single stuck-at faults in the network were given. The network is based on the generalized polarity and coincidence product-of-sum OR-Coincidence expression of logical functions, and its Exclusive- NOR （EXNOR） part employs cascade or tree structure. The network of EXNOR-cascade structure only requires adding two control points and one observation point, and the one of EXNOR-tree structure only .requires adding four control points and one observation point, consequently the testability is improved. For an n-variable function, the cardinal numbers of universal test sets for the two structures are （n＋7） and （n＋10） respectively. Such short universal test sets are very suitable to be generated by Built-in Self-Test, and the test time can be saved greatly.

关 键 词：通用测试集 可测性设计 或-符合展开 单固定故障 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]