B样条曲面拟合在Mura缺陷获取中的应用  

Application of B-spline Fitting Surface to Detection of MuraAlignment Nematic Controlled by Fringe Field Switching

作　　者：唐剑[1] 王大巍[1] 李新国[1] 梁珂[1] 闫亮[1] 董友梅[1] 

机构地区：[1]京东方科技集团股份有限公司

出　　处：《现代显示》2008年第6期24-28,共5页Advanced Display

摘　　要：TFT-LCDMura缺陷表现为对比度低、亮度区域不均匀、边界模糊,通常大于一个像素,会给观察者带来视觉不适,是一种比较常见的缺陷。长期以来,对Mura缺陷的检测都是由经过训练的专业检验员完成。近年来,研究人员开始研究利用机器来代替人眼检测,但机器如何获取Mura缺陷一直是行业内公认的难题之一。本文提出了基于B样条曲面拟和的方法来获取Mura缺陷信息,并通过对大量真实Mura缺陷样本的检测验证了该方法具有高的获取准确率。Mura is a familiar kind of visual defect in TFT-LCD, which is understood as defects with low contrast, non-uniform brightness regions, vague contour, and typically larger than a single pixel. It imparts an unpleasant sensation to viewers. Most of final Mura inspection has been done by experienced human inspectors for a long time. Recently, researchers expect to detect it using machine instead of human eyes, but how to detect it correctly is always one of difficulties accepted by TFT-LCD industry. A method of detecting Mura based on B-spline surface fitting is proposed in this paper, Performance of the proposed method is evaluated on many real TFT-LCD panel samples, The experimental result shows it is an effective method to detect Mura with high detection rate.

关 键 词：Mura TFT-LCD 曲面拟合 B样条 

分 类 号：TN141.9[电子电信—物理电子学]