微处理器故障注入工具与故障敏感度分析  

Fault Inject Tool and Fault Sensitivity Characterization for Microprocessor

作　　者：张英武[1] 袁国顺[1] 

机构地区：[1]中国科学院微电子研究所,北京100029

出　　处：《半导体技术》2008年第7期589-591,599,共4页Semiconductor Technology

摘　　要：总结了单粒子效应的各种表现形式,明确在集成电路抗单粒子加固时应着重考虑单粒子翻转和单粒子瞬变。通过分析、对比大量故障注入方法,设计了基于仿真的自动故障注入及分析系统,具有模型准确、运行速度快、自动化程度高等特点。采用此系统分析了一款32 bit RISC微处理器对单粒子翻转和单粒子瞬变两种故障的敏感度。通过注入约2×105个故障,保证了实验的统计意义。试验分析指出,在设计加固微处理器时应该着重考虑存储单元、时钟信号和关键模块。The main forms of single event event transmission were focused when hardening effect were summarized, and the single event upset and single design. By analyzing and comparing some fault inject tools, a automatic fault injection and analysis system （AFIAS） was designed, which has characteristics of the precise fault model, high speed and autoimmunization. With AFIAS, a microprocessor＇ s fault sensitivity was analyzed by injecting SEU and SET. Based on this tool about 2 × 10^5 faults were injected into microprocessor. The statistics resuhs show how to design a high reliability microprocessor.

关 键 词：故障注入 单粒子效应 高可靠微处理器 

分 类 号：TN302[电子电信—物理电子学]