Zn_(0.96)Mn_(0.04)O薄膜的制备及结构、磁性分析  

Preparation,Structural and Magnetic Properties Analysis of Zn_(0.96)Mn_(0.04)O Films

作　　者：刘清华[1] 曲蛟[2] 史彬茹[3] 刘永利[1] 

机构地区：[1]邢台学院物理系,河北邢台054001 [2]河北建筑工程学院数理系,河北张家口075024 [3]河北交通职业技术学院,河北石家庄050091

出　　处：《河北师范大学学报（自然科学版）》2008年第4期474-477,491,共5页Journal of Hebei Normal University：Natural Science

基　　金：国家自然科学基金(10774037);河北省自然科学基金(E2007000280)

摘　　要：采用射频溅射法制备了Zn0.96Mn0.04O薄膜样品,并对样品进行了结构和性能的检测,其中使用的靶材是通过标准固态反应法制备的.经过X射线衍射分析,样品均未被发现任何杂质相,都表现为纤锌矿结构.磁性测量表明,薄膜样品在室温下表现出较强的铁磁性,每个Mn离子的饱和磁化强度为1.05μB,矫顽力为0.01 T,居里温度高于400 K.分析表明,薄膜样品所检测到的铁磁性不是杂质相的贡献,而是MnZnO的内禀性质,并且生长环境及缺陷对样品的铁磁性产生了很大的影响.Zn0.96Mn0.04O thin films were prepared by radio-frequency magnetron sputtering. The structural and magnetic properties were examined in detail. The rf target was produced by standard solid-state reaction processes. From the X-ray diffraction, all the samples were wurtzite structure and no secondary phase was found. Magnetic measurements indicate that the thin films were ferromagnetic at room temperature with a transition temperature of about 400 K. The largest saturated magnetization was found to be about 1.05 μB/Mn, while the coercive force was found to be 0.01 T at room temperature. The ferromagnetism was not the contribution of impurities, but a intrinsic property. Additionally, the growth conditions and defects played an important role in producing ferromagnetism.

关 键 词：Zn0. 96Mn0.04O薄膜 射频溅射法 磁性 

分 类 号：O484[理学—固体物理]