时序电路测试生成新算法研究  

Study on New Algorithm of Test Pattern Generation for Sequential Circuits

作　　者：黄玉玲[1] 王勇[1] 

机构地区：[1]桂林电子科技大学电子工程学院,广西桂林541004

出　　处：《无线电工程》2008年第7期49-52,共4页Radio Engineering

基　　金：广西自然科学基金项目(桂科自05420510)

摘　　要：为解决同步时序电路的测试难题,提高时序电路测试生成效率,进行了时序电路测试生成算法的研究,将粒子群优化算法应用在时序电路的测试生成中。为验证PSO算法性能,首先将其用于函数优化,能获得较好的优化结果。之后建立自动测试生成离散粒子群速度—位置模型,针对国际标准时序电路的验证结果表明,与同类算法相比,该算法可以获得较高的故障覆盖率和较小的测试矢量集。In order to solve the hard problem of testing for synchronous sequential circuits, improve the test generation efficiency of sequential circuits, this paper studies the algorithm of test pattern generation for sequential circuits. This paper applies particle swarm optimization algorithm to the test generation of sequential circuits. In order to confirm the PSO performance, it is applied to optimize function firstly. The result shows that the algorithm is effective, then the speed-position model of discrete particle swarm optimization for automatic test generation is made. The experimental results for benchmark circuits show that the proposed algorithm can achieve higher fault coverage and more compact test sets when compared to other similar test generation algorithms.

关 键 词：PSO算法 函数优化 惯性权重模型 自动测试生成 

分 类 号：TN407[电子电信—微电子学与固体电子学]