非晶材料晶化过程温度-电特性测试系统的设计  

Design of Temperature-Electrical Property Test System for Crystallization Process of Amorphous Material

作　　者：王晓兰[1] 张万宏[2] 寇生中 王慧中[1] 

机构地区：[1]兰州理工大学电气工程与信息工程学院,甘肃兰州730050 [2]青海大学化工学院,青海西宁810016 [3]甘肃省有色金属新材料省部共建国家重点实验室,甘肃兰州730050

出　　处：《测控技术》2008年第8期31-32,共2页Measurement & Control Technology

基　　金：甘肃省自然科学基金资助项目(ZS022-A25-039);甘肃省有色金属新材料国家重点实验室开放基金(SKL05010)

摘　　要：提出了非晶材料晶化过程温度控制和电阻率测试的总体设计方案,介绍了测试系统的控制算法及硬件和软件设计。在电阻率测试中采用四探针方法,克服了接触电阻和引线电阻的影响;在温度控制中采用了组合自校正算法,满足了调节和跟踪两个方面的要求。试验表明,本测试系统完全满足了非晶材料晶化过程电特性研究的需要。The temperature control and resistivity test system for crystallization process of amorphous material are designed. The control algorithm and the configuration of the hardware and software for the system based on microcontroller are introduced. In the system, the algorithm of combined self-tuning for temperature control that can satisfy simultaneously the performances of servo-tracking is proposed. In addition, the four-probe measurement approach that can overcome effect of contact and lead wire resistance is used. The result of the practical application shows that the system approaches the requirement for the study of crystallization process.

关 键 词：晶化过程 温度控制 自校正 电阻率测试 MSP430 

分 类 号：TP368[自动化与计算机技术—计算机系统结构]