模拟电路中三极管和运放的软故障诊断  

Soft Fault Diagnosis of Transistor and Op-amp in Analog Circuits

作　　者：胡梅[1] 王红[1] 杨士元[1] 胡庚[1] 

机构地区：[1]清华大学自动化系,北京100084

出　　处：《微电子学》2008年第4期493-496,501,共5页Microelectronics

基　　金：国家自然科学基金资助项目(60773142;60633060);教育部博士点专项基金资助项目(20070003122)

摘　　要：基于文献[1]中的斜率故障模型,提出了一种诊断模拟电路中晶体三极管和集成运算放大器软故障的字典法。在含有三极管和运放的电路中,通过对三极管和运放进行等效模型替代,对替代之后的等效电路,利用电路中的两节点电压增量计算出的斜率作为统一故障特征,建立故障字典,实现原电路中三极管和运放的软故障诊断。给出了三极管和运放的等效模型分析和诊断步骤,并用仿真实例证明了诊断方法的有效性。Based on the slope fault model of Ref. [1], a fault dictionary method was proposed for soft fault diagnosis of bipolar junction transistor （BJT） and integrated operational amplifier （OA） in analog circuits. In the analog circuit with BJT and OA, equivalent models were used to replace them. For the equivalent circuit after replacement, slope calculated by two node voltage increments was used as unified fault feature, and a fault dictionary was established to diagnose soft fault of BJT and OA in the original circuit. Equivalent models of BJT and OA were analyzed, and the diagnosis approach was described in detail, Finally, examples were given to demonstrate the effectiveness of the diagnosis method.

关 键 词：模拟电路 软故障诊断 斜率故障模型 晶体三极管 运算放大器 

分 类 号：TN407[电子电信—微电子学与固体电子学]