平面光路中交叉波导的损耗和串扰研究  

Research on Loss and Crosstalk of Cross-waveguide in Planar Lightwave Circuit

作　　者：万助军[1] 袁菁[1] 吴亚明[2] 罗风光[1] 

机构地区：[1]华中科技大学光电子科学与工程学院,湖北武汉430074 [2]中国科学院上海微系统与信息技术研究所,上海200050

出　　处：《半导体光电》2008年第4期475-477,共3页Semiconductor Optoelectronics

基　　金：华中科技大学博士后科研专项基金资助项目

摘　　要：在大规模平面光路器件的布版中不可避免地会发生光波导交叉情况,交叉波导引入的损耗和串扰随交叉角度的变化而变化。文章围绕这个问题制作了硅基二氧化硅交叉波导样品并进行了损耗及串扰测试,结果表明,采用大于25°的交叉角度,可使每个交叉点的损耗小于0.1 dB,串扰小于-40 dB,满足器件的设计要求。Crossings of waveguides are inescapable in layout of lager scale planar lightwave circuit devices. Loss and crosstalk by cross-waveguides are influenced by the crossing angle. In this paper, presented are the results of a series of experiments for the silica-based intersection waveguide. The results show that using more than 25° angle of the intersection of crosswaveguide can meet the devices design requirements with loss less than 0.1 dB and crosstalk less than -40 dB at every crossing.

关 键 词：集成光学 平面光路 交叉波导 损耗 串扰 

分 类 号：TN252[电子电信—物理电子学]