在120keV质子辐照下环氧树脂的质损效应  

Mass Loss Effects for AG-80 Epoxy Resin Under 120 keV Proton Exposure

作　　者：高禹[1] 董尚利[1] 杨德庄[1] 刘勇[1] 李志君 

机构地区：[1]哈尔滨工业大学材料科学与工程学院 [2]电子科技集团公司第39研究所,陕西西安710065

出　　处：《高分子材料科学与工程》2008年第9期72-75,共4页Polymer Materials Science & Engineering

基　　金：国家重点基础研究专项经费资助项目(G19990650)

摘　　要：对AG-80环氧树脂浇注体进行了120 keV质子辐照试验,测试了质子辐照前后AG-80的质损率,借助AFM、XPS对环氧树脂表面的形貌、化学成分和化学结构进行了分析。试验结果表明,随质子辐照剂量增加,质损率首先增加,随后变化趋于平缓;表面粗糙度先增加后减小。在质子辐照的作用下,AG-80环氧树脂表面离子碎片逸出和表面层发生炭化是其质损和表面粗糙度发生变化的原因。Irradiation of 120 keV protons was performed for the AG-80 epoxy resin and mass loss was examined. The ehanges in surfaee morphology were examined by Atomie Foree Mieroseopy （AFM）. The variation in surfaee ehemistry was eharaeterized by X-ray Photoelectron Spectroscopy. Experimental results show that with increasing the proton fluenee, the surface colour of specimens is getting darker. Mass loss ratios increase with increasing proton fluenee, then level off. The surface roughness of specimens exhibits an increasing trend followed by decreasing as a function of proton fluenee. The ehanges in mass loss and surfaee roughness of the AG-80 epoxy resin could be attributed to the formation of the ion pieces and the enriehment of carbon content in the skin layer due to proton radiation.

关 键 词：环氧树脂 质子辐照 质损 

分 类 号：O631.34[理学—高分子化学]