谱线线型对双光干涉的影响  

Influence of Spectral-line-shape on Double-beam Interference

作　　者：谢先闻[1] 

机构地区：[1]浙江教育学院理工学院,浙江杭州310012

出　　处：《浙江教育学院学报》2008年第4期66-72,共7页Journal of ZHEJIANG Education Institute

摘　　要：考虑实际光源所发出的谱线的几种基本线型:洛仑兹线型、高斯线型和综合加宽机制下的综合线型的双光干涉.导出了这几种线型的谱线的双光干涉强度和反衬度公式,揭示了不同谱线线型双光干涉强度和反衬度随光程差、谱线宽度的变化规律.研究表明,常规的根据平顶型线型反衬度为零对谱线相干长度的定义对实际的线型仅是近似的;在考虑取一定反衬度误差的条件下,给出采用平顶型这一近似的模型代替实际谱线的判据.Influence of some basic spectral-line-shapes, such as Lorentzian spectral line profile, Gaussian spectral line profile and synthesize spectral line profile produced by real light source on two optical beams interference is considerd respectively. The analytical formulas for the light intensity distribution and visibility of interference fringes are derived. The formulas presented here reflect the different laws of change in the intensity and visibility followed the optical path difference and spectral linewidth for different spectral line profile. It is indicated that the definition of coherent length derived from the zero visibility of the model of equal intensity profile, in the strict sense, is approximate for real profile. Within certain limits of error a feasible criterion that uses the model of equal intensity profile to take the place of real profile is derived.

关 键 词：谱线线型 谱线宽度 双光干涉 强度分布 反衬度 

分 类 号：O43[机械工程—光学工程]