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作 者:赵晓英[1] 刘世建[1] 褚君浩[2] 戴宁[2] 胡古今[2]
机构地区:[1]上海师范大学数理信息学院,上海200234 [2]中国科学院上海技术物理研究所,上海200083
出 处:《物理学报》2008年第9期5968-5972,共5页Acta Physica Sinica
基 金:国家自然科学基金(批准号:60578058,10774154和60221502);国家杰出青年基金(批准号:60225004)资助的课题~~
摘 要:采用化学溶液沉积法在LaNiO3涂布的硅晶片上制备了高度(100)择优取向,表面均匀、平整、致密无裂纹的PbZr0.5Ti0.5O3/PbZr0.4Ti0.6O3双层膜.双层膜具有单一的钙钛矿相,同时拥有良好的铁电性能,剩余极化强度高达64μC/cm2,平均矫顽场仅为43.6 kV/cm.棱镜-薄膜耦合实验结果表明PbZr0.5Ti0.5O3/PbZr0.4Ti0.6O3双层膜系表现出平板光波导特征,能够承载四个横电模;通过求解模式本征方程分别得到了PbZr0.4Ti0.6O3膜层和PbZr0.5Ti0.5O3膜层的折射率及厚度参数.The uniform, dense, and crack-free PbZr0.4 Ti0.6 O3/PbZr0.5 Ti0.5 O3 bilayer with (100)-preferred crystal orientation and a single perovskite phase was fabricated on LaNiO3-coated Si substrate by using chemical solution deposition. The bilayer exhibits excellent ferroelectric properties, remnant polarization of 64 μC/cm^2 and coercive field of 43.6 kV/cm. The prism-film coupling measurement indicates that four transverse electric modes can be excited in the system of Si/LaNiO3/PbZr0.5 Ti0.5 O3/PbZr0.4Ti0.6 O3 and the light can be effectively confined to propagate in the guiding-layer. The refractive index and thickness for each film were obtained by solving the mode eigen-equation of the waveguide.
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