避免键联接产生装配干涉的公差设计方案  

Tolerancing design methods of avoiding assembly interferences in key connections

作　　者：刘丽云[1] 胡海东[1] 刁金霞[2] 

机构地区：[1]廊坊职业技术学院机械工程系,河北廊坊065000 [2]廊坊职业技术学院电气工程系,河北廊坊065000

出　　处：《河北工业科技》2008年第5期278-280,共3页Hebei Journal of Industrial Science and Technology

摘　　要：分析了键联接进行装配时产生干涉的具体情况,介绍了保证键联接顺利装配的2种公差设计方案,并对各方案的含义、图样标注和应用特点进行了介绍。The various situations of assembly interference in the key connections are analysed. Two tolerancing design methods of guaranteeing the key connections are introduced. The concepts, the marks in drafts and the special features of both methods are introduced.

关 键 词：键联接 对称度 延伸公差带 最小实体要求 

分 类 号：TH124[机械工程—机械设计及理论] TH131.4