扫描电镜-X射线能谱法测定镀金饰品的镀层结构  

Determination of Coating Layers′ Structure of Gold plating Decorations by SEM & EDAX

作　　者：陈 陈朝旭 

机构地区：[1]福建省测试技术研究所

出　　处：《分析测试学报》1997年第5期75-76,共2页Journal of Instrumental Analysis

摘　　要：介绍一种测定镀金饰品镀层结构的方法。该法可测定厚度为几十纳米的镀层成分。A method for determination of coating layers′ structure of decorations is introduced in this paper Coating layers with thickness of several tens of nanometer can be determined by this method

关 键 词：X射线能谱仪 扫描电镜 镀金饰品 金镀层 

分 类 号：O614.123[理学—无机化学] TS934.2[理学—化学]