光电耦合器的辐照损伤机理研究现状及趋势  

Research Status and Developing Trends of Irradiation Damage Mechanism of Optocouplers

作　　者：李应辉[1,2] 陈春霞[2] 蒋城[2] 刘永智[1] 陈向正 

机构地区：[1]电子科技大学光电信息学院,四川成都610054 [2]重庆光电技术研究所,重庆400060 [3]北大附中重庆实验学校,重庆401122

出　　处：《半导体光电》2008年第5期621-624,630,共5页Semiconductor Optoelectronics

摘　　要：随着光电耦合器件在空间环境和核辐射领域的广泛应用,近年来对光电耦合器件的抗辐照性能的研究越来越多。文章主要介绍了辐照对光电耦合器的损伤机理,重点介绍了光电耦合器的辐照效应,特别是电参数辐照效应;针对光电耦合器目前研究的情况,分析了其研究趋势,并提出了一种新的光电耦合器辐照研究方法———低频噪声可靠性表征方法。As wide applications of optocouplers in space environment and nuclear radiation, more and more researches focus on its anti-irradiation characteristics. The irradiation damage mechanism is presented, especially the electric irradiation effect. According to the research status, its developing trends are analyzed and a new method for analyzing irradiation, lowfrequency noise reliability characterization, is proposed.

关 键 词：光电耦合器 辐照效应 辐照损伤机理 

分 类 号：TN36[电子电信—物理电子学]