一种基于哑元的扩展相容性扫描树方法  

An Extended Compatibilities Scan Tree Architecture Based on Dummy Scan Cells

作　　者：刘先霞[1] 高清华[2] 文俊[3] 尤志强[4] 

机构地区：[1]湖南大学数学与计量经济学院,湖南长沙410082 [2]北京城市学院理工学部,北京100083 [3]北京东华合创数码科技股份有限公司,北京100086 [4]湖南大学软件学院,湖南长沙410082

出　　处：《湖南大学学报（自然科学版）》2008年第11期74-78,共5页Journal of Hunan University:Natural Sciences

基　　金：国家自然科学基金资助项目(60673085);教育部留学回国人员科研启动基金资助项目

摘　　要：尽管扩展相容性扫描树技术可以彻底地降低测试应用时间和平均测试功耗,扫描输出的个数却大大增加.这使得测试响应的数据量增加,从而为测试响应压缩带来困难.本文提出一种基于哑元的扩展相容性扫描树方法.在这种方法里,为了不破坏未移动的扫描单元之间的关系,在移动扫描单元时一些没有实际意义的扫描单元被加进来.此方法有效地降低了电路的扫描输出个数.从而降低了测试响应数据量,节省了许多数据压缩的硬件.实验结果展示了我们的方法在保持改进的扩展相容性方法的优点的同时,扫描输出的个数比原始的扩展相容性方法有显著的降低,对于ISCAS’89的部分电路,扫描输出的个数最大降低了26.0%.The extended compatibilities scan tree techniques can drastically reduce test application time and average power. However, the number of scan outputs of those methods is increased significantly. Thus, it leads to the increase of test response data volume and the difficulty of test response compaction. This paper proposed a new scan tree architecture of extended compatibilities based on dummy san cells. In the pro[yosed method, .some dummy scan cells were inserted to keep the relation between the unmoved scan cells when rome scan cells were moved to other compatible sets. The proposed method can effectively reduce the number of scan outputs and test response data volume and its hardware overhead of compaction. Experiment results have shown that our approach achieves smaller number of scan outputs, while keeping almost the same test application time, test input data volume and test power, compared with the previous methods. For ISCAS＇ 89 benchmark circuits, the test response data volume was reduced up to 26.0%.

关 键 词：可测性设计 全扫描测试 扫描树 低功耗测试 

分 类 号：TP302[自动化与计算机技术—计算机系统结构]