由一般拓扑度量空间所产生的Alignment空间  

The Alignment Space Generated by General Metric Spaces

作　　者：卢国祥[1] 沈世镒[1] 

机构地区：[1]南开大学数学科学学院与LPMC,天津300071

出　　处：《工程数学学报》2008年第6期1097-1101,共5页Chinese Journal of Engineering Mathematics

基　　金：天津市科技发展计划项目(043185111-17)

摘　　要：Alignment空间是一个在广义误差下定义的度量空间。在以往的信息处理问题中,一般只讨论离散状态下的序列比对Alignment问题,并由此产生一种新的非线性度量空间-Alignment空间。本文将离散状态下的Alignment空间推广到一般情况,得到了由一般拓扑度量空间所产生的Alignment空间仍然是度量空间,并证明了Alignment距离与Levenshtein距离的等价性。The alignment space is a metric space which is defined by generalized errors. In the past information processing, we only discuss the sequence alignment problems under the discrete state assumption, and get a new nonlinear metric space - the alignment space. In this paper, we extend the alignment space to the continuous state condition. We show that the alignment space generated by general metric spaces is also a metric space, and prove that the alignment distance is equivalent to the Levenshtein distance.

关 键 词：由度量空间产生的Alignment空间 度量空间的基本定理 Alignment距离 Levenshtein距离 

分 类 号：O17[理学—数学] O236[理学—基础数学]