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作 者:李德高[1] 王万良[1] 闵芳胜[2] 沈海平[3]
机构地区:[1]浙江工业大学信息学院,浙江杭州310014 [2]杭州远方光电信息有限公司,浙江杭州310053 [3]复旦大学光源与照明工程系,上海200433
出 处:《液晶与显示》2008年第6期722-725,共4页Chinese Journal of Liquid Crystals and Displays
摘 要:提出了用理想因子n评价大功率LED可靠性的新方法。通过对大功率LEDI-V曲线的拟合计算出理想因子n的数值,对大功率LED进行电流加速老化试验,用最小二乘法算法将ln-t关系拟合成一条直线从而测得大功率LED的寿命,并据此讨论了大功率LED的理想因子与其寿命的关系。实验结果证明,理想因子n可以用于评价大功率LED的可靠性。This paper presents that the reliability of high power LEDs can be evaluated by the ideal factor n. The ideal factors of high power LEDs were got by studying their I-V characteristics. The electric current accelerated aging experiments were carried out on these high-power LEDs. The relation between lnφ and t can be fitted into a linear using the least square method in order to get the lifetime of high power LEDs. The relation between ideal factors of high power LEDs and their lifetime was discussed. The experimental results showed that the reliability of high-power LEDs can be evaluated by the ideal factor n.
分 类 号:TN312.8[电子电信—物理电子学] O471[理学—半导体物理]
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