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机构地区:[1]南京理工大学电子工程与光电技术学院,南京210094
出 处:《光子学报》2008年第12期2572-2575,共4页Acta Photonica Sinica
基 金:兵器科技预研项目(30404010103)资助
摘 要:定量分析了SOFRADIR公司生产的320×240凝视型非制冷焦平面探测器关键偏置电压FID、VEBASAGE对焦平面探测器输出的影响.通过测试发现,焦平面驱动电路板所处系统内部环境温度在某一温度附近有振荡现象,理论上推导出了焦平面驱动电路所处系统内部环境温度在(-10℃,40℃)的缓慢漂移以及振荡均能使关键偏置电压产生毫伏级漂移的结论.结果表明,焦平面驱动电路所处系统内部环境温度变化严重影响了焦平面探测器输出的稳定性并改变了红外图像的非均匀性,为基于环境温度补偿的非均匀性校正算法研究提供了依据.The influence of critical bias voltage on FPA detector output was analyzed quantificationally. In the system the critical bias voltages FID and VEBASAGE were necessary to the 320 × 240 staring uncooled FPA detector produced by SOFRADIR CO. LTD. By testing the environment temperature around FPA drive board inside the system, the vibration at some temperature was found. The conclusion that the slow temperature excursion of the environment temperature at-10 -40℃ round FPA drive board inside the system and vibratory resulted in the variety of several milli-volts of critical bias voltage were put forward. The results show that the variety of environment temperature inside the system affects the stability and also changes the nonuniformity of FPA detector output. This will be the basis of nonuniformity correction based on environment temperature compensation.
关 键 词:光学 红外图像 红外焦平面阵列 环境温度变化 非均匀性
分 类 号:TN215[电子电信—物理电子学]
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