高可靠微处理器的设计  

A Design of High Reliability Microprocessor

作　　者：张英武[1] 郭天雷[1] 袁国顺[1] 

机构地区：[1]中国科学院微电子研究所,北京100029

出　　处：《微电子学与计算机》2009年第1期59-62,共4页Microelectronics & Computer

摘　　要：随着集成电路特征尺寸的降低,由空间射线引起的单粒子效应(single event effect,SEE)愈发严重.首先从工艺、版图、电路和系统四个层次考虑,介绍了一些常见的加固方法,然后采用基于仿真的故障注入工具分析了一款微处理器各个模块的故障敏感度,根据统计数据,采用基于DICE的加固D触发器替换原来的触发器和在微处理器关键模块采用冗余算法的两种方法加固了微处理器.Single event effect caused by radiation is becoming more serious with the integrated circuit scaling. Firstly, some radiation hardened technology for SEU from the following four aspects： process, layout, circuit and system are introduced, and then, all block＇ fault sensitivity of a microprocessor is analyzed by a fault injection tool. Finally a hardened microprocessor is designed by using DICE D Flip-Flop and redundancy design on some key blocks of microprocessor.

关 键 词：微处理器 加固技术 单粒子 故障注入 

分 类 号：TN47[电子电信—微电子学与固体电子学]