掺钴氧化锌稀磁半导体的SEM及X射线能谱微分析研究  

Microanalysis Study of Co-Doped ZnO DMS Crystal by SEM and XREDS

作　　者：仇满德[1] 姚子华[1] 韦志仁[2] 翟永清[1] 田帅[2] 张爽[1] 

机构地区：[1]河北大学化学与环境科学学院,河北保定071002 [2]河北大学物理与技术学院,河北保定071002

出　　处：《光谱学与光谱分析》2009年第1期277-280,共4页Spectroscopy and Spectral Analysis

基　　金：国家自然科学基金项目(50472037);河北省自然科学基金项目(E2004000117)资助

摘　　要：采用水热法,以CoCl2.6H2O为前驱物,KOH作为矿化剂合成了掺钴氧化锌稀磁半导体晶体。利用扫描电子显微镜(SEM)及X射线能谱仪(XREDS)对合成晶体的微观形貌、表面及内部掺杂元素Co的相对含量和分布的均匀性进行了研究。研究结果表明:水热法合成的掺Co氧化锌晶体具有多种微观形貌,较大的晶体具有极性生长特性。随晶体形貌不同,显露面也发生了相应改变。不同微观形貌的晶体其Co含量有所差异,较大的晶体掺杂Co元素相对含量大于较小的晶体,+c(1011)显露面Co元素的含量比+c(1010)面高,锥柱状晶体其区别尤为明显。大的晶体内部存在着少量的氧化钴团簇,晶体表面与晶体内部Co元素分布相对均匀。由于Co2+具有磁性,因此,氧化钴团簇的存在将对氧化锌稀磁半导体晶体的磁性产生一定的影响。In the present paper,with CoCl2·6H2O used as precursor,Co-doped ZnO diluted magnetic semiconductor（DMS）crystals were synthesized by hydrothermal method with KOH as mineralizer.The morphology,and the relative content and distribution uniformity of the surface and inner Co element of synthesized crystals were investigated by scanning electron microscope（SEM） and X-ray energy dispersive spectrometry（XREDS）,respectively.It was found that Co-doped ZnO crystals with different morphology were yielded,while the bigger crystals showed polar growth charactertistics,and the Co content in the crystal depended on its morphology.The exposed face also changed with crystal morphology.There was more Co in bigger crystals than in smaller ones.Moreover,more Co located in ＋c（1011）compared to ＋c（1010）exposed face,especially for cone crystals.In addition,it was observed that there was a little amount of cobalt oxide cluster in inner crystal,and the distribution of Co content was relative uniform in both the surface and inner part of the crystal.Cobalt oxide cluster may have effect on the magnetic properties of Co-doped ZnO diulted magnetic semiconductor since Co2＋ possesses magnetic property.

关 键 词：微分析 稀磁半导体 ZNO晶体 水热法 

分 类 号：O433.1[机械工程—光学工程]