边界扫描技术及其在电路板级测试应用  

Boundary Scan Technology and Its Application in Board Level Test

作　　者：张琳[1] 周拥军[1] 刘冲[1] 武飞[1] 

机构地区：[1]中航工业洛阳电光设备研究所,河南洛阳471009

出　　处：《电光与控制》2009年第2期60-63,共4页Electronics Optics & Control

摘　　要：介绍了边界扫描测试技术的基本原理,提出了边界扫描技术的板级测试策略和整体测试流程,并对扫描链路设计中的具体问题进行分析,最后结合可测试性设计提出了电路板设计时应遵循的原则。The basic principle of performance test based on Boundary Scan （BS） technology is briefly discussed. A test strategy and a flow chart for board level test by using boundary scan are presented, and the problem in the design of BS Chain is analyzed. In the end, combined with the consideration of Design For Test, we present some fundamentals that should be followed in design of the PCBs.

关 键 词：边界扫描 板级测试 可测试性设计 JTAG 

分 类 号：V271.4[航空宇航科学与技术—飞行器设计]