采用动态邻域扩展算法的非一致CA低功耗确定TPG  

Low Power Deterministic Test Pattern Generator Based on Non-uniform Cellular Automata using Dynamical Extend Algorithm

作　　者：曹贝[1] 肖立伊[1] 王永生[1] 

机构地区：[1]哈尔滨工业大学微电子中心,哈尔滨150001

出　　处：《计算机辅助设计与图形学学报》2009年第1期37-43,共7页Journal of Computer-Aided Design & Computer Graphics

摘　　要：针对确定内建自测试向量发生器设计中常存在着对冗余向量依赖,导致测试应用时间增长,并产生额外的测试功耗等问题,提出一种新的低功耗确定测试向量发生器的综合算法.该向量发生器采用非一致细胞自动机的结构实现,利用基于模拟退火的动态邻域扩展算法寻找优化的细胞自动机的拓扑连接关系.对标准组合电路仿真实验的结果表明,所综合出的向量发生器可有效地产生给定的低功耗确定向量集,并且不影响原有的故障覆盖率和测试时间.The test pattern generator （TPG） in deterministic BIST often suffered from problems during the synthesis, such as depending on redundant test patterns, and resulting in extra test power consumption and idle test cycles. An efficient algorithm was proposed to synthesize a built-in TPG from low power deterministic test patterns without inserting any redundancy test vectors. The structure of TPG was based on the non-uniform cellular automata （CA） and was used to test combinational circuits. The key idea of algorithm was to dynamically extend the neighborhood based on simulated annealing for finding the optimal non-uniform CA topology. Simulation results on benchmark combinational circuits showed that the proposed algorithm is efficient in synthesizing low power deterministic TPGs, with no effects on fault coverage and test time.

关 键 词：内建自测试 确定向量发生器 细胞自动机 

分 类 号：TP206.1[自动化与计算机技术—检测技术与自动化装置]