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作 者:郭春凤[1] 齐文宗[1] 王德飞[1] 于继平[1]
出 处:《激光与红外》2009年第3期260-263,共4页Laser & Infrared
摘 要:为描述飞秒激光辐照半导体材料的热力响应过程,扩展了热电子崩力和自恰场两种模型,得到了完全耦合的非线性热弹方程组。在单轴应力条件下,利用有限差分法,计算了500 fs脉冲激光作用下硅膜内载流子温度、晶格温度、热应力和热电子崩力的变化情况,同时考虑了能量密度和薄膜厚度两个因素的影响。数值结果表明:能量密度越高达到热平衡所需的时间就越长;对于比较薄的硅膜,随着激光作用时间的增加,热应力的双峰逐渐增加并由前后表面同时向薄膜的中间移动。To describe thermomechanical response of semiconductors subjected to femtosecond laser heating,the hot-electron blast and complete self-consistent models are extended. A set of fully coupled thermoelasticity equations is derived based on the assumption of uniaxial stress. Numerical analysis is performed for a thin silicon film heated by a 500fs laser pulse using a finite difference method. It is shown that it takes a longer time for a high fluence to establish the thermal equilibrium than that for a low fluence. On the other hand, as time prolongs, two peaks of thermal stress inrease gradually and move towards the center region of the film for a very thin silicon film.
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