楔条形阳极探测器的性能测试与分析  

Analysis and Testing of Wedge-and-Strip Anode Detector Characteristics

作　　者：刘永安[1,2] 赵宝升[1] 朱香平[1] 缪震华[1,2] 张兴华[1,2] 邹玮[1] 

机构地区：[1]中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室,西安710119 [2]中国科学院研究生院,北京100049

出　　处：《光子学报》2009年第4期750-755,共6页Acta Photonica Sinica

基　　金：中科院知识创新工程方向性项目资助

摘　　要：对研制出的楔条形阳极探测器进行了性能分析与实验测试,分析了引起成像畸变的三个重要因素:到达阳极的电子云半径大小、阳极的电容耦合效应和电子读出电路的性能.电子云半径的过大或过小会相应引起成像的"S"畸变或调制畸变,电容耦合效应和电路噪音也均会引起成像的畸变.此外,测试了探测器的暗计数率、线性度以及空间分辨率等性能,同时分析了微通道板在光照情况下的增益特性和暗计数的一般特性及其产生原因.测试结果表明探测器的成像畸变很小、线性关系较好,空间分辨率优于150μm,微通道板的暗计数率低于0.4count/s*cm2.The characteristics of WSA （Wedge and strip anode） detector are analyzed and tested. Three factors which can induce the image distortion,the charge cloud size which collected by WSA,the capacitive coupling between different electrodes and the performance of electronics,are discussed. Modulation and ＂S＂ distortion can be appeared if the charge cloud is too small or too large. Image distortion can be also introduced by inter-electrode capacitance and electronic noise. Moreover, the position resolution, image linearity and background rate of detector are tested. And the general characteristics and origins of background events were also analyzed It＇s suggested that the distortion of image is very small, image linearity is good ,position resolution is superior to 150 μm and overall background rate is -0.4 counts/s cm^2 .

关 键 词：阳极探测器 楔条形阳极 微通道板 暗计数 分辨率 

分 类 号：TN23[电子电信—物理电子学] O434.2[机械工程—光学工程]