软硬件测试中预确定距离测试  

Pre-determined Distance Testing for Hardware and Software Testing

作　　者：朱经纷[1] 徐拾义[1] 

机构地区：[1]上海大学计算机工程与科学学院,上海200072

出　　处：《计算机科学》2009年第5期133-137,共5页Computer Science

基　　金：国家自然科学基金资助项目(60473033)资助

摘　　要：在随机测试的基础上提出了VLSI电路测试中的一个新概念,即预确定距离测试。随机测试广泛应用于软硬件测试中已经有多年了。众所周知,随机测试中每个测试码都是随机选取的而不管它是否与先前生成的测试码重复。尽管由于测试码选取的随机性使得随机测试并不是十分有效,但是对它作了一些实质性修改从而大大提高了它的测试效率。在预确定距离测试中,总是选择总距离最大的测试码来进行测试,以便使得该测试码所检测到的故障与先前的测试码所检测到的故障尽可能地不同。还详细介绍了构造一个预确定距离测试序列的生成算法,并将其应用到软件测试中。最后,从基准电路上获得的实验结果以及从理论上的分析也表明这种新方法的有效性。This paper, based on the random testing,introduced a new eoncept of so called Predetermined Distance Testing （PDDT） for VLSI circuits. Random testing has been employed for years in both software and hardware testing. It is well known that in random testing each test requires to be selected randomly regardless of the tests previously generated. Although random testing could be inefficient for its random selection of test patterns,some essential modifications have been adopted in PDDT to improve the testing efficiency. In this newmethod, the total distance among all test patterns is chosen maximal so that the set of faults detected by one test pattern is as different as possible from that of faults detected by the tests previously applied. Procedure of constructing a predetermined distance test sequence （PDDTS） and its application in software testing were described in detail. Experimental results from Benchmark as well as theoretical analysis were also given to evaluate the performances of our new approach.

关 键 词：随机测试 海明距离 笛卡儿距离 生成矩阵 预确定距离 

分 类 号：TP306[自动化与计算机技术—计算机系统结构]