新型OLED测试系统的设计与实现  

Design and Implementation of Novel OLED Test System

作　　者：彭强[1,2] 姚若河[1] 

机构地区：[1]华南理工大学电子与信息学院,广州510640 [2]汕尾职业技术学院电子信息系,广东汕尾516600

出　　处：《半导体技术》2009年第5期467-469,共3页Semiconductor Technology

摘　　要：为了满足OLED准确批量测试及降低系统成本的需要,根据表征OLED器件性能指标的特点,设计并建立了一套可测试OLED电流密度-电压-亮度以及器件衰减曲线的测试系统。该系统在计算机程控测控稳压电源的控制下,可同时对多路OLED进行测试并实现了OLED屏的加速老化的测试,采用光敏二极管传感器代替了通常使用的辉度计,降低了系统的成本。系统最终输出数据结果由计算机记录,提高了数据采样的准确性,对OLED制作的材料和工艺的评测提供了精确的参考数据。To meet the needs of the OLED batch accurate tests and reducing the system cost, a set of testing system that can test OLED current density-voltage-brightness as well as the component curve was designed and established according to the characteristics of the OLED component performance index. Under the computer program control with observing voltage-stabilized source, the system may carry out multi-channel OLED test and the OLED screen accelerated aging test simultaneously. Secondly, the cost of the system was reduced by applying the photodiode sensor to replace the brightness photometer which was usually used. The system output data is recorded by the computer enhancing accurate data sampling and precise reference data to be provided to the OLED manufacture material and technics evaluation.

关 键 词：有机发光显示器件 寿命 测试系统 批量测试 老化测试 加速老化测试 

分 类 号：TN383.1[电子电信—物理电子学]