采用响应曲面方法实现IC的稳健优化设计  

IC robust optimization design using RSM

作　　者：游海龙[1] 贾新章[2] 

机构地区：[1]西安电子科技大学微电子学院,陕西西安710071 [2]西安电子科技大学宽禁带半导体材料与器件教育部重点实验室,陕西西安710071

出　　处：《西安电子科技大学学报》2009年第3期458-462,共5页Journal of Xidian University

基　　金：模拟集成电路国家重点实验室基金资助(51439040103DZ0102)

摘　　要：由于仿真不收敛等问题,仅依靠EDA仿真很难实现集成电路(IC)稳健性设计.提出了利用响应曲面(RSM)与电路仿真相结合对集成电路进行稳健性优化设计的方法.并将该方法应用于带隙基准电路稳健优化设计.通过Hspice电路仿真与统计试验设计(DOE),仅利用27组试验建立了3目标值、4参数电路的响应曲面模型.并基于该模型对电路进行稳健性设计,优化确定的参数组合满足电路指标,同时对温度的变化更加不敏感.Because of non-convergence and other problems the IC robustness design can not be achieved by only relying on the EDA simulation. A method is presented that uses the Response surface methodology （RSM） combined with EDA simulation designs, optimizes circuits for robustness, and is applied to the design of band-gap reference circuit. Through Hspice simulation and experimental design, the model of 3 objects and 4 parameters is built using 27 experiments. Based on the model the circuit is optimized for robustness. The optimized parameter sets satisfying the design targets make the circuit output more insensitive to the temperature variation.

关 键 词：稳健优化设计 响应曲面法(RSM) 试验设计(DOE) 

分 类 号：TN722[电子电信—电路与系统]