基于局部熵的CMOS摄像头疵点检测  

Defect detection of CMOS camera based on local entropy

作　　者：沈雅芬[1] 刘纯平[1] 王朝晖[1] 

机构地区：[1]苏州大学计算机科学与技术学院,江苏苏州215006

出　　处：《计算机工程与应用》2009年第20期71-73,77,共4页Computer Engineering and Applications

基　　金：江苏省大学生实践创新训练计划;苏州大学国家大学生创新性实验项目;莙政基金

摘　　要：在CMOS摄像头数字图像性能检测系统中,疵点检测是关键内容。基于局部熵,提出了基于局部熵的CMOS摄像头疵点检测方法。与原有的摄像头疵点检测方法进行比较,局部熵方法是一种自适应的疵点检测方法。实验结果表明,该方法能够准确、有效地检测到摄像头的疵点。In the digital image performance testing system of CMOS camera,defect detection is crucial.This paper proposes a defect detection of CMOS camera based on local entropy.Compared to the former method of defect detection on the camera,the local entropy method is adaptive.Experimental results have shown that the proposed method is accurate and efficient for detecting defect on the camera.

关 键 词：局部熵 数字图像 疵点检测 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]