基于库替换技术的单粒子效应故障注入仿真  

Single-Event-Effects Emulation Based on Library-Replace-Modeling Technique

作　　者：郑宏超[1] 范隆[1] 岳素格[1] 刘立全[1] 

机构地区：[1]北京微电子技术研究所,北京100076

出　　处：《微电子学与计算机》2009年第7期60-64,共5页Microelectronics & Computer

摘　　要：提出了一种新的故障注入仿真方法,研发了故障单元库替换仿真工艺库技术,与以往方法相比,该技术可以方便快速地在目标电路的所有节点上注入故障来模拟SEE,因而更贴近实际物理过程,仿真结果可以得到所有节点的敏感度信息并评价电路总体抗SEE性能,供初期芯片设计人员参考改进.同时利用C#程序和FPGA硬件加速仿真,使得故障注入更加便捷高效,注入速度达到了8.03μs/fault.Fault injection is an important technique for validating SEE in early chip design period. A novel library-replace- modding technique that can quickly and easily perform SEE by injecting faults into the circuit nodes is proposed. It helps IC designers to enhance the quality of their design by providing the sensitivity information of all nodes. This technique help the experiment results he more close to the real physical process. Also the fault injection effectiveness is improved by utilizing C# program and FPGA emulation, and the speed of injection can reach 8.03 us/fault.

关 键 词：故障注入 FPGA仿真 SEE 

分 类 号：TP302.8[自动化与计算机技术—计算机系统结构]