基于电流的CLB测试方法研究  

Development of CLB testing method based on IDDA

作　　者：朱才荣[1,2] 颜学龙[1] 

机构地区：[1]桂林电子科技大学电子工程学院,桂林541004 [2]江苏省淮安信息职业技术学院,淮安223003

出　　处：《仪器仪表用户》2009年第4期15-17,共3页Instrumentation

摘　　要：本文以Xilinx系列FPGA(Field Programmable Gate Array)器件为主要的研究对象,在详细研究FPGA内部结构的基础上,对其中的可编程逻辑模块CLB(Configurable Logic Block)的子模块进行电流测试的尝试,利用SPICE软件对其进行仿真,并在此基础上建立了故障模型,对故障模型和无故障模型进行电流测试,从仿真的结果可以非常清楚地看出两者电流的差别,说明了这种方法的可行性。The topic of this paper is Xilinx series FPGA （ Field Programmable Gate Array ） devices. Based on studied the internal structure of FPGA in detail, we attempt to one of sub-module of the programmable logic block CLB （Configurable Logic Block） do current testing. A fault model was based to use the SPICE simulation software. Crossed the simulation results of fault model and fault-free model current testing, that can be seen very clearly the difference between the two current. ALL of this shows the feasibility of this method.

关 键 词：FPGA测试 CLB 电流测试 SPICE仿真 

分 类 号：TP331.11[自动化与计算机技术—计算机系统结构]