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作 者:赵俊[1,2] 杨根庆[1,2] 丁星肇 林梓鑫[1,2] 江炳尧 周祖尧[1,2] 柳襄怀
机构地区:[1]中国科学院上海冶金研究所离子束开放研究实验室 [2]中国科学院上海冶金研究所传感技术国家重点实验室
出 处:《功能材料与器件学报》1998年第3期198-202,共5页Journal of Functional Materials and Devices
摘 要:报道了用叠加能量Si+、N+共注入SiO2薄膜研究硅基发光材料。Si+、N+先后注入SiO2薄膜,并在衬底中重叠。样品退火后在紫外光激发下,可以观察到很强的紫外(~340nm)和紫色(~427nm)光致发光(PL)。还研究了光致发光激发(PLE)谱并对发光机制进行了探讨。Si based light emission materials were fabricated by Si +, N + coimplanting into SiO 2 films, Si + and N + ions were sequentially implanted with three energies and the distribution of both ions were overlapped in the implanted region. Short wavelength peaks at~340nm and ~ 427nm were measured in room temperature PL spectra of the annealed samples. Photoluminescence excitation (PLE) spectra were also studied and the light emission mechanisms are briefly discussed.
分 类 号:TN204[电子电信—物理电子学]
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