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作 者:崔启明[1] 江志裕[1] 郁祖湛[1] 应质峰[2]
机构地区:[1]复旦大学化学系,上海200433 [2]复旦大学物理系
出 处:《应用化学》1998年第4期104-106,共3页Chinese Journal of Applied Chemistry
摘 要:The partial deposit films on p-silicon wafers were formed from three kinds of plating solution: chloro-platinic acid, potassium tetranitroplatinate and diammine platinium dinitrate under Nd: YAG laser irradiation. The compositions and properties of the depositswere investigated by AES, SEM and XPS techniques. The Pt deposits have ohmic contactwith p-type silicon.The partial deposit films on p-silicon wafers were formed from three kinds of plating solution: chloro-platinic acid, potassium tetranitroplatinate and diammine platinium dinitrate under Nd: YAG laser irradiation. The compositions and properties of the depositswere investigated by AES, SEM and XPS techniques. The Pt deposits have ohmic contactwith p-type silicon.
分 类 号:TN305.99[电子电信—物理电子学]
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