云母波片偏光干涉谱随温度变化的漂移  

Drift of polarization interference spectrum of mica wave-plate varying with temperature

作　　者：孔凡美[1] 李国华[1] 郝殿中[1] 宋致堂[1] 

机构地区：[1]曲阜师范大学激光研究所,曲阜273165

出　　处：《激光技术》2009年第5期538-540,共3页Laser Technology

摘　　要：为了研究云母波片的偏振参量受温度影响的情况,测量了不同温度下云母波片的偏光干涉谱。利用岛津UV-3101PC分光光度计,在其样品室中加入温控装置,改变波片的温度,对80μm,227.5μm,300μm和813.5μm 4个不同厚度的云母波片进行测量,结果发现,当温度升高时,波片的偏光干涉谱整体向短波长方向发生漂移,且温度变化越大,漂移越明显,这是由波片的厚度和双折射率受温度影响而引起的。结果表明,漂移的偏光干涉谱对于研究云母波片具有精确、直观、简单的优点,这为研究云母波片的偏振参量随温度的变化提供了方法。In order to measure the variation of polarization parameter of mica wave-plate varying with temperature, the polarization interference spectrum of mica wave-plate at different temperature was measured with Daojing UV-3101PC spectrophotometer,in whose sample chamber, a temperature control device was set up to change the temperature of the wave-plate. After measuring the polarizatlon interference spectrum of four mica wave-plates in 80μm,227.5μm,300μm and 813.5μm thick respectively, it was found that the spectrum drifted to shorter wavelength. Moreover, the drift was more obvious when the variation of temperature was larger because of the variation of thickness and birefringence of the wave-plate varying with temperature. The drifted polarization interference spectrum is accurate and visual and simple, which offers an effective method for measuring the variation of polarization parameter of mica wave-plate varying with temperature.

关 键 词：晶体光学 偏光光干涉谱 漂移 温度 

分 类 号：O439[机械工程—光学工程]