高亮发光二极管寿命评价  

Evaluation of High-bright LED's MTTF

作　　者：闫德立[1] 高金环[2] 高兆丰[2] 徐立生[2] 

机构地区：[1]石家庄铁道学院,石家庄050051 [2]国家半导体器件质量监督检验中心,石家庄050051

出　　处：《半导体技术》2009年第10期978-980,共3页Semiconductor Technology

摘　　要：高亮发光二极管广泛应用于户外显示屏、交通灯、汽车灯及电子设备和工业设备指示灯等方面,因其具有体积小、功耗低、寿命长、反映速度快、适合量产等诸多优点,因而使用市场巨大,对其寿命评价尤显意义重大。通过温度应力的加速寿命试验对某高亮型LED的平均寿命进行了快速评价,设计采取单一加速应力的试验方法,通过建立加速模型,进行加速试验,采用退化系数解析法进行数据处理,最终得到了室温下该高亮型LED的平均寿命。High-bright LEDs are widely used automobile lambs, indicator lamps of electronic and in the field of open air display screen, traffic lights, industry equipment for its advantages of small size, low power dissipation, long life, short response time, easy mass-produce. The evaluation of high-bright LED （mean time to failure） MTI＇F has very important practical meaning. Quick evaluation was carried out on a certain high-bright LED by temperature stress accelerate life test, a single accelerate stress was adopted in the Test. Through building an accelerate life model, experiment and data processing were carried out by means of degenerate coefficient analysis. The MTTF of the high-bright LED at room temperature was finally obtained.

关 键 词：发光二极管 光通量 退化系数 加速寿命 平均寿命 

分 类 号：TN364.2[电子电信—物理电子学] TN306