不同^(60)Co γ剂量率下10位双极D/A转换器的总剂量效应  

Total Dose Effect of 10-bit Bipolar D/A Converter Under Different ^(60)Co γ Dose Rates

作　　者：王义元[1,2] 陆妩[1] 任迪远[1] 郑玉展[1,2] 高博[1,2] 李鹏伟[1,2] 于跃[1,2] 

机构地区：[1]中国科学院新疆理化技术研究所,新疆乌鲁木齐830011 [2]中国科学院研究生院,北京100049

出　　处：《原子能科学技术》2009年第10期951-955,共5页Atomic Energy Science and Technology

摘　　要：为探索电离辐射对数模混合电路的影响,对国产10位双极D/A转换器在60Co γ射线不同剂量率辐照下的电离辐射效应及退火特性进行研究。结果表明:D/A转换器对辐照剂量率十分敏感,在大剂量率辐照时,电路功能正常,各功能参数变化较小;在低剂量率辐照下,各参数变化显著,电路功能出现异常,表现出明显的低剂量率损伤增强效应。最后,结合空间电荷模型对其电离辐射损伤机理进行了初步探讨。In order to find the responses of digital-to-analog （D/A） converters in ionizing radiation environment, total dose effect and room-temperature annealing behavior of a 10-bit bipolar D/A converter irradiated by different^ 60 Coγ dose rates were investigated. The D/A converter is quite sensitive to dose rates, and its functions are normal at high dose rate irradiation. While under low-dose-rate ease, it works out of the way and many parameters go beyond its permitted range. Thus, it exhibits an enhanced low- dose-rate sensitivity effect. Finally, possible mechanism was discussed based on the space charge model.

关 键 词：双极数模转换器 剂量率 电离效应 低剂量率损伤增强效应 

分 类 号：TN431[电子电信—微电子学与固体电子学] TN792