薄膜磁电阻效应自动测试系统的研制  

Auto measurement System of the Magnetoresistance Effect in Films

作　　者：郑远开[1] 于军[1] 李佐宜[1] 彭子龙 谢基凡[1] 刘卫忠[1] 缪向水 

机构地区：[1]华中理工大学电子科学与技术系

出　　处：《磁性材料及器件》1998年第5期50-53,共4页Journal of Magnetic Materials and Devices

摘　　要：介绍了磁性薄膜磁电阻效应自动测试系统。该系统采用单片８０３１来模拟三角波输出而构成超低频扫场电源，用平面直列式四探针测量磁电阻，通过电压补偿法对薄膜的电阻进行取样，数据经过Ａ／Ｄ转换，输入计算机进行处理，从而对薄膜的磁电阻效应实现自动测试。The auto measurement system of the magnetoresistance effect in films was designed.This system’s ultralow frequency source is generated by the MCS 8031,and the magnetoresistance is measured by the four point method.By means of the voltage compensation,the A/D conversion and the computer aided test,the system can auto measure the magnetoresistance of the films.

关 键 词：磁电阻效应 计算机辅助测试 磁性薄膜 测试 

分 类 号：O484.43[理学—固体物理] TM271.014[理学—物理]