基于三次样条插值的IRFPA非均匀性校正算法  

Nonuniformity Correction Algorithms of IRFPA Based on Cubic Spline Function

作　　者：李恩科[1] 刘上乾[1] 王炳健[1] 殷世民[1] 

机构地区：[1]西安电子科技大学技术物理学院,西安710071

出　　处：《光子学报》2009年第11期3016-3020,共5页Acta Photonica Sinica

基　　金：国家自然科学基金(60377034)资助

摘　　要：针对红外成像制导跟踪系统工程应用的实际要求,对红外焦平面阵列工作在大动态范围条件下的非均匀性校正算法进行了深入研究,依据函数插值原理,导出了三次样条插值非均匀性校正算法.用模拟的非均匀性图像和实际的红外图像对算法进行了校验.结果表明该算法具有动态范围大、校正准确度高的优点,可对红外焦平面阵列实现非均匀性和非线性双重校正效果.The nonuniformity correction algorithm of IRFPA under the broad dynamic range is studied for the engineering applications of infrared imaging guidance and track systems.The nonuniformity correction algorithm based on cubic spline function interpolation is derived based on the function interpolation principle.This algorithm is validated by a simulated nonuniform image and a real infrared image captured by 128×128 infrared imaging system.Experiments＇ results show that this algorithm has the adavantages such as broad dynamic range and high correction precision,which realizes double correction to nonuniformity and nonlinearity of IRFPA.

关 键 词：红外焦平面阵列 非均匀性校正 三次样条插值 

分 类 号：TN215[电子电信—物理电子学]