平面光学元件光圈数检测系统研究  

Study on the Inspection System for the Value of Light Ring of the Plane Optical Element

作　　者：江晓军[1] 冯荣达[1] 刘正国[1] 秦琴[1] 

机构地区：[1]上海第二工业大学,上海201209

出　　处：《光电子技术》2009年第3期179-181,共3页Optoelectronic Technology

摘　　要：平面光学元件的光圈数是反映光学元件面形质量的重要参数。通过分析检测原理与方法,设计了一套应用光学技术、CCD成像技术、图像处理技术与计算机软件技术的检测系统。实验表明:该检测系统具有客观性强、易操作、准确度较高等特点。The value of light ring of the plane optical element is the important parameter that reflects the profile quality of the optical element.After the inspection principle and the method are analyzed,an inspection system employing optics technique,CCD imaging technique,image processing technique and computer software technique has been designed.Experimental results show that the inspection system has the characteristics of simple operation,strong objectivity and better accuracy.

关 键 词：测量 条纹分析 电荷耦合器件 

分 类 号：TH741[机械工程—光学工程]