FSS设计中栅瓣现象的研究  

Study on the sidelopes for FSS design

作　　者：王婕[1] 邓晖[1] 董金明[1] 

机构地区：[1]北京航空航天大学电子信息工程学院,北京100191

出　　处：《电子测量技术》2010年第1期25-28,共4页Electronic Measurement Technology

摘　　要：栅瓣现象是影响频率选择表面(FSS)性能的重要因素,良好的FSS设计需要在工作频段内尽量避开或削弱栅瓣效应产生的影响。首先从电磁波传播的角度阐述了栅瓣现象产生的原因和条件。然后,依据周期结构的Floquet定理,总结了栅瓣与高阶Floquet可传播模式之间的联系,并且给出了Floquet模式的物理意义。同时针对厚壁波导型FSS结构进行仿真分析,研究其阵列周期及单元排布方式等因素对栅瓣的影响,并对大角度入射条件下的FSS设计提出了有价值的建议。The phenomenon of sidelopes is an important affecting factor in the design of FSS. In order to design a FSS with excellent performance, the sidelopes should be avoided or weakened as could as possible. The paper explains the causes and conditions of sidelopes from the perspective of electromagnetic wave propagation. Then, the connections between sidelopes and high-level Floquet modes are summarized based on the Floquet theorem. The thick-screen waveguide-type FSS under irradiation with a large incident angle are simulated in cases of different array type, to analyze the impact of sidelopes in separate situation, and suggestions are mode to the design of FSS used in case of irradiation with a large incident angle.

关 键 词：频率选择表面(FSS) FLOQUET定理 Floquet模式 栅瓣 

分 类 号：TN973.3[电子电信—信号与信息处理]