基于STM32微控制器的过采样技术研究与实现  

Study and Implementation of Oversampling Technology Based on STM32

作　　者：吴家平[1] 沈建华[1] 

机构地区：[1]华东师范大学计算机科学与技术系,上海200241

出　　处：《计算机技术与发展》2010年第2期209-212,共4页Computer Technology and Development

摘　　要：针对微控制器自带ADC精度较低而外部高精度ADC价格较高的情况,介绍了过采样技术提高微控制器ADC精度的基本原理,对其在基于Cortex-M3内核的STM32微控制器上的实现进行了可行性分析。经过初步数据分析,证明过采样技术可以在该微控制器上实现。结合微控制器特性,给出了具体的软件实现方法,并对其进行了测试。论文在最后还对过采样技术给处理器带来的负荷以及其本身的局限性进行了分析。实验证明,在STM32微控制器上使用过采样技术,能够减小处理器负荷、有效地提高其自带ADC的精度。Due to low resolution of ADC in the micro controller unit and increase of cost if external ADC of high resolution is used, the oversampling technology is introduced to improve the resolution of ADC. Introduce the theory of the oversampling technology and analyse the feasibility of the specific realizing on the Cortex - M3 Core - based STM32 micro controller unit. By analyzing the raw data, the technology is approved feasible on the micro controller unit. According to the specific characteristic of the micro controller unit, the concrete software realizing method is provided and tested. At last, the affect to processor by the technology and the limitation of the technology itself is analyzed. The practical experiment and the results approve that the oversampling technology can effectively improve the resolution of ADC in STM32 micro controller unit, while not increasing the load of processor.

关 键 词：量化 过采样 抽取 DMA 

分 类 号：TP335[自动化与计算机技术—计算机系统结构]