基于正弦曲线拟合算法的ADC测试改进方法  

Improved ADC Measurement Approach Based on Sine Wave Fitting

作　　者：桑龙[1,2] 陈静[3] 

机构地区：[1]西北工业大学,西安710072 [2]海军装备部,西安710054 [3]西安科技大学,西安710054

出　　处：《电讯技术》2010年第2期69-72,共4页Telecommunication Engineering

摘　　要：当ADC测试数据与理想模型的偏差为随机的高斯噪声时,基于正弦曲线的ADC测试方法能够取得较好的拟合效果,然而实际应用时却经常发现标准的正弦曲线测试往往会出现一些偏差。为了减少拟合时的不确定因素,对正弦曲线拟合过程进行了分析,通过仿真找出了产生偏差的主要因素,并对其进行了更正。仿真结果表明了该方法的有效性。In Gauss PDF error environment, the ADC measurement method based on sine wave fitting per- forms well. However, there has some deviation during sine wave test. To reduce the uncertainty, the sine wave fitting process is analysed,and the main influencing factor is found though sinndation and is also im- proved. Simulation result demonstrates the effectiveness of this improved method.

关 键 词：测控设备 模拟数字转换器 正弦匹配 量化噪声 最小均方 

分 类 号：TN79[电子电信—电路与系统]