表面等离子共振谱半波全宽的算法探讨  

Research on Calculating Full Width of Half Maxium of Surface Plasmon Resonance Spectrum

作　　者：吴英才[1] 顾铮先[2] 

机构地区：[1]广东海洋大学信息学院,广东湛江524088 [2]上海理工大学理学院,上海200093

出　　处：《光子学报》2010年第1期53-56,共4页Acta Photonica Sinica

基　　金：国家自然科学基金(6077035)资助

摘　　要：根据金属薄膜复介电常量的性质和衬底对表面等离子波波矢的微扰,对在波长调制下的表面等离子共振传感器输出光谱的半波全宽计算方法进行了探讨。建立了输出光谱的半波全宽与传感器各参量之间关系的数学表达式。将理论研究与实验结果进行对比后发现,两者吻合较好。文中的研究结果可为优化传感器的特性提供理论依据。Based on the characteristics of compound permittivity of metal film and the perturbation to wavevector of surface plasmon wave, the full wave half maxium of optical spectrum has been investigated under thesurface plasmon resonance sensors in wavelength interrogation. A mathematical expression has been established to describe the relation between the FWHM and parameters of the SPR sensors. The oretical research is consistent with previous experimental results and it could be employed to be theoretical guidance in optimizing properties of SPR sensors.

关 键 词：光学传感器 表面等离子共振 金属薄膜 光谱 半波全宽 

分 类 号：TP212.14[自动化与计算机技术—检测技术与自动化装置]