Design and test results of a low-noise readout integrated circuit for high-energy particle detectors  被引量:1

Design and test results of a low-noise readout integrated circuit for high-energy particle detectors

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作  者:ZHANG Mingming CHEN Zhongjian ZHANG Yacong LU Wengao JI Lijiu 

机构地区:[1]Key Laboratory of Microelectronic Devices and Circuits, Institute of Microelectronics, Peking University, Beijing, 100871, China

出  处:《Nuclear Science and Techniques》2010年第1期44-48,共5页核技术(英文)

基  金:Supported by the National Natural Science Foundation of China (No.40704025)

摘  要:A low-noise readout integrated circuit for high-energy particle detector is presented.The noise of charge sensitive amplifier was suppressed by using single-side amplifier and resistors as source degeneration.Continuous-time semi-Gaussian filter is chosen to avoid switch noise.The peaking time of pulse shaper and the gain can be programmed to satisfy multi-application.The readout integrated circuit has been designed and fabricated using a 0.35 μm double-poly triple-metal CMOS technology.Test results show the functions of the readout integrated circuit are correct.The equivalent noise charge with no detector connected is 500–700 e in the typical mode,the gain is tunable within 13–130 mV/fC and the peaking time varies from 0.7 to 1.6 μs,in which the average gain is about 20.5 mV/fC,and the linearity reaches 99.2%.A low-noise readout integrated circuit for high-energy particle detector is presented. The noise of charge sensitive amplifier was suppressed by using single-side amplifier and resistors as source degeneration. Continuous-time semi-Gaussian filter is chosen to avoid switch noise. The peaking time of pulse shaper and the gain can be programmed to satisfy multi-application. The readout integrated circuit has been designed and fabricated using a 0.35μm double-poly triple-metal CMOS technology. Test results show the functions of the readout integrated circuit are correct. The equivalent noise charge with no detector connected is 500-700 e in the typical mode, the gain is tunable within 13 130 mV/fC and the peaking time varies from 0.7 to 1.6 μs, in which the average gain is about 20.5 mV/fC, and the linearity reaches 99.2%.

关 键 词:读出集成电路 高能粒子探测器 低噪声 设计 测试 CMOS工艺 峰值时间 单端放大器 

分 类 号:TN215[电子电信—物理电子学] TL815[核科学技术—核技术及应用]

 

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